See what other methods leave hidden – with high-resolution electron microscopy and customized analysis packages at the IFW Dresden.





The IFW Dresden offers comprehensive electron microscopy services (SEM & TEM) for high-resolution structural analysis of a wide variety of materials. Our equipment enables not only conventional imaging but also combined analyses using energy-dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS/ELNES). In situ experiments provide additional insights into dynamic structural changes under real-world conditions. Through in-house sample preparation – including thin-film deposition – we handle complete material analysis from a single source.







Your benefits



• Imaging down to the sub-nanometer range

• Combined structural and chemical analysis for precise material characterization

• In-situ experiments under realistic operating conditions

• Complete on-site sample preparation for fast results

• Wide range of materials from metals to ceramics to nanostructures



Methods



• Scanning electron microscopy (SEM) and transmission electron microscopy (TEM)

• EDXS for elemental analysis

• EELS/ELNES for electronic structure investigations

• In-situ heating and loading experiments

• Thin film deposition and preparation for material and multilayers





Fields of application



• Quality control and damage analysis

• Development and optimization of functional layers

• Characterization of nanostructures (e.g. graphene, CNTs)

• Analysis of multilayer systems with special magnetic or electronic properties

• Investigation of thin protective and functional layers